Normal view MARC view ISBD view

Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China

Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China - Bellingham, Wash: SPIE, 2002 - xiii, 548 p. : ill. ; 28 cm

ISBN: 9780819447081

Subjects--Topical Terms:
Detectors - Materials - Congresses

Dewey Class. No.: 621.381 YAO

Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)