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Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA

Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA - Bellingham, Wash: SPIE, 2007 - 1 v. (various pagings) : ill. ; 28 cm

ISBN: 9780819468208

Subjects--Topical Terms:
Nanotechnology - Congresses

Dewey Class. No.: 621.381045 DUP

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