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Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA - Bellingham, Wash: SPIE, 2002 - viii, 192 p. : ill. ; 28 cm

ISBN: 9780819445469

Subjects--Topical Terms:
Information storage and retrieval systems - Congresses

Dewey Class. No.: 621.36 DOP

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